10. IOLTS 2004:
Funchal,
Madeira Island,
Portugal
10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal.
IEEE Computer Society 2004, ISBN 0-7695-2180-0 BibTeX
Opening Session-Keynote Talk
Session 1:
Timing and Transient Faults
Session 2:
Self Testing and Self Checking Circuits
Session 3:
Checker and Voter Design
Session 4:
Concurrent Error Detection
Panel Session 1:
On Emerging Field Reliability and Dependability Challenge
Session 5:
Microprocessor On-Line Testing
Session 6:
On-Line Testing Evaluation
Session 7:
Error Correcting Code Based Fault Tolerance
- Amine M'sir, Fabrice Monteiro, Abbas Dandache, Bernard Lepley:
Designing a High Speed Decoder for Cyclic Codes.
129-134
Electronic Edition (link) BibTeX
- Daniele Rossi, A. Muccio, André K. Nieuwland, Atul Katoch, Cecilia Metra:
Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems.
135-140
Electronic Edition (link) BibTeX
- Gian-Carlo Cardarilli, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano:
A Signed Digit Adder with Error Correction and Graceful Degradation Capabilities.
141-148
Electronic Edition (link) BibTeX
Session 8:
Reconfiguration,
Repair,
and Reuse for Fault Tolerance
Session 9:
Posters
- Eberhard Böhl, Elmar Dilger, M. Böhl:
A New Code with Reduced EMI and Partial EC Possibilities.
175
Electronic Edition (link) BibTeX
- Thomas O'Shea, Ian A. Grout:
A Matlab Based On-Chip Signal Generation and Analysis Environment for Mixed Signal Circuits.
176
Electronic Edition (link) BibTeX
- André K. Nieuwland, Patrick Gindner:
Automated Logic SER Analysis and On-Line SER reduction.
177
Electronic Edition (link) BibTeX
- Jose Miguel Vieira dos Santos:
On the Design of Long-Life Reliable Systems for Ground-Based Applications.
178
Electronic Edition (link) BibTeX
- Rodrigo Picos, Miquel Roca, Eugeni Isern, Sebstatià A. Bota, Eugenio García:
On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA.
179
Electronic Edition (link) BibTeX
- Carlos Arthur Lang Lisbôa, Luigi Carro:
An Intrinsically Robust Technique for Fault Tolerance under Multiple Upsets.
180
Electronic Edition (link) BibTeX
- Petr Fiser, Hana Kubatova:
Survey of the Algorithms in the Column-Matching BIST Method.
181
Electronic Edition (link) BibTeX
- Debjyoti Ghosh, Swarup Bhunia, Kaushik Roy:
A Technique to Reduce Power and Test Application Time in BIST.
182-183
Electronic Edition (link) BibTeX
- Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra:
Optimization of the Theory of FDD of DES for Alleviation of the State Explosion Problem and Development of CAD Tools for On-line Testing of Digital VLSI Circuits.
184-
Electronic Edition (link) BibTeX
Session 10:
Built In Self Test
Session 11:
Safety and Security
- Nikolaos G. Bartzoudis, Alexandros G. Fragkiadakis, David J. Parish, Jose Luis Nunez:
A System for Fault Detection and Reconfiguration of Hardware Based Active Networks.
207-213
Electronic Edition (link) BibTeX
- Elmar Dilger, Roland Karrelmeyer, Bernd Straube:
Fault Tolerant Mechatronics.
214-218
Electronic Edition (link) BibTeX
- David Hély, Marie-Lise Flottes, Frédéric Bancel, Bruno Rouzeyre, Nicolas Bérard, Michel Renovell:
Scan Design and Secure Chip.
219-226
Electronic Edition (link) BibTeX
Session 12:
Dependability Evaluation
Panel Session 2:
Reliability Implications of Statistical Design
Copyright © Sat May 16 23:24:15 2009
by Michael Ley (ley@uni-trier.de)
