André K. Nieuwland

2008
14	EE	Daniele Rossi, André K. Nieuwland, Cecilia Metra: Simultaneous Switching Noise: The Relation between Bus Layout and Coding. IEEE Design & Test of Computers 25(1): 76-86 (2008)
13	EE	Daniele Rossi, André K. Nieuwland, Steven V. E. S. van Dijk, Richard P. Kleihorst, Cecilia Metra: Power Consumption of Fault Tolerant Busses. IEEE Trans. VLSI Syst. 16(5): 542-553 (2008)
2006
12	EE	André K. Nieuwland, Samir Jasarevic, Goran Jerin: Combinational Logic Soft Error Analysis and Protection. IOLTS 2006: 99-104
2005
11	EE	André K. Nieuwland, Atul Katoch, Daniele Rossi, Cecilia Metra: Coding Techniques for Low Switching Noise in Fault Tolerant Busses. IOLTS 2005: 183-189
10	EE	Régis Leveugle, Yervant Zorian, Luca Breveglieri, André K. Nieuwland, Klaus Rothbart, Jean-Pierre Seifert: On-Line Testing for Secure Implementations: Design and Validation. IOLTS 2005: 211
9	EE	Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra: Exploiting ECC Redundancy to Minimize Crosstalk Impact. IEEE Design & Test of Computers 22(1): 59-70 (2005)
8	EE	Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra: New ECC for Crosstalk Impact Minimization. IEEE Design & Test of Computers 22(4): 340-348 (2005)
2004
7	EE	Claudia Kretzschmar, André K. Nieuwland, Dietmar Müller: Why Transition Coding for Power Minimization of On-Chip Buses Does Not Work. DATE 2004: 512-517
6	EE	Daniele Rossi, A. Muccio, André K. Nieuwland, Atul Katoch, Cecilia Metra: Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems. IOLTS 2004: 135-140
5	EE	André K. Nieuwland, Patrick Gindner: Automated Logic SER Analysis and On-Line SER reduction. IOLTS 2004: 177
4	EE	André K. Nieuwland, Atul Katoch, Maurice Meijer: Reducing Cross-Talk Induced Power Consumption and Delay. PATMOS 2004: 179-188
3	EE	André K. Nieuwland, Richard P. Kleihorst: IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors. J. Electronic Testing 20(5): 533-542 (2004)
2003
2	EE	Daniele Rossi, Steven V. E. S. van Dijk, Richard P. Kleihorst, André K. Nieuwland, Cecilia Metra: Power Consumption of Fault Tolerant Codes: the Active Elements. IOLTS 2003: 61-67
1	EE	André K. Nieuwland, Richard P. Kleihorst: The positive effect on IC yield of embedded Fault Tolerance for SEUs. IOLTS 2003: 75-

Coauthor Index

1	Luca Breveglieri	[10]
2	Steven V. E. S. van Dijk	[2] [13]
3	Patrick Gindner	[5]
4	Samir Jasarevic	[12]
5	Goran Jerin	[12]
6	Atul Katoch	[4] [6] [8] [9] [11]
7	Richard P. Kleihorst	[1] [2] [3] [13]
8	Claudia Kretzschmar	[7]
9	Régis Leveugle	[10]
10	Maurice Meijer	[4]
11	Cecilia Metra	[2] [6] [8] [9] [11] [13] [14]
12	A. Muccio	[6]
13	Dietmar Müller	[7]
14	Daniele Rossi	[2] [6] [8] [9] [11] [13] [14]
15	Klaus Rothbart	[10]
16	Jean-Pierre Seifert	[10]
17	Yervant Zorian	[10]

Colors in the list of coauthors