Bipul C. Paul
List of publications from the
2008 |
26 | EE | Bipul Chandra Paul,
Shinobu Fujita,
Masaki Okajima:
ROM based logic (RBL) design: High-performance and low-power adders.
ISCAS 2008: 796-799 |
2007 |
25 | EE | Mridul Agarwal,
Bipul C. Paul,
Ming Zhang,
Subhasish Mitra:
Circuit Failure Prediction and Its Application to Transistor Aging.
VTS 2007: 277-286 |
24 | EE | Bipul Chandra Paul,
Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(4): 743-751 (2007) |
23 | EE | Bipul C. Paul,
Shinobu Fujita,
Masaki Okajima,
Thomas Lee:
Prospect of ballistic CNFET in high performance applications: Modeling and analysis.
JETC 3(3): (2007) |
2006 |
22 | EE | Bipul C. Paul,
Shinobu Fujita,
Masaki Okajima,
Thomas Lee:
Modeling and analysis of circuit performance of ballistic CNFET.
DAC 2006: 717-722 |
21 | EE | Bipul Chandra Paul,
Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits.
DATE 2006: 780-785 |
20 | EE | Arijit Raychowdhury,
Bipul Chandra Paul,
Swarup Bhunia,
Kaushik Roy:
Ultralow power computing with sub-threshold leakage: a comparative study of bulk and SOI technologies.
DATE 2006: 856-861 |
19 | EE | Kunhyuk Kang,
Bipul C. Paul,
Kaushik Roy:
Statistical timing analysis using levelized covariance propagation considering systematic and random variations of process parameters.
ACM Trans. Design Autom. Electr. Syst. 11(4): 848-879 (2006) |
18 | EE | Aditya Bansal,
Bipul Chandra Paul,
Kaushik Roy:
An Analytical Fringe Capacitance Model for Interconnects Using Conformal Mapping.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(12): 2765-2774 (2006) |
17 | EE | Bipul Chandra Paul,
Amit Agarwal,
Kaushik Roy:
Low-power design techniques for scaled technologies.
Integration 39(2): 64-89 (2006) |
16 | EE | Bipul C. Paul,
Kaushik Roy:
Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS Circuits.
J. Electronic Testing 22(2): 115-124 (2006) |
2005 |
15 | EE | Kunhyuk Kang,
Bipul Chandra Paul,
Kaushik Roy:
Statistical Timing Analysis using Levelized Covariance Propagation.
DATE 2005: 764-769 |
14 | EE | Amit Agarwal,
Bipul Chandra Paul,
Hamid Mahmoodi-Meimand,
Animesh Datta,
Kaushik Roy:
A process-tolerant cache architecture for improved yield in nanoscale technologies.
IEEE Trans. VLSI Syst. 13(1): 27-38 (2005) |
13 | EE | Arijit Raychowdhury,
Bipul Chandra Paul,
Swarup Bhunia,
Kaushik Roy:
Computing with subthreshold leakage: device/circuit/architecture co-design for ultralow-power subthreshold operation.
IEEE Trans. VLSI Syst. 13(11): 1213-1224 (2005) |
2004 |
12 | EE | Woopyo Jeong,
Bipul Chandra Paul,
Kaushik Roy:
Adaptive supply voltage technique for low swing interconnects.
ASP-DAC 2004: 284-287 |
11 | EE | Seung Hoon Choi,
Bipul Chandra Paul,
Kaushik Roy:
Novel sizing algorithm for yield improvement under process variation in nanometer technology.
DAC 2004: 454-459 |
10 | EE | Amit Agarwal,
Bipul Chandra Paul,
Kaushik Roy:
A Novel Fault Tolerant Cache to Improve Yield in Nanometer Technologies.
IOLTS 2004: 149-154 |
9 | EE | Bipul Chandra Paul,
Arijit Raychowdhury,
Kaushik Roy:
Device optimization for ultra-low power digital sub-threshold operation.
ISLPED 2004: 96-101 |
8 | EE | Bipul Chandra Paul,
Cassondra Neau,
Kaushik Roy:
Impact of Body Bias on Delay Fault Testing of Nanoscale CMOS Circuits.
ITC 2004: 1269-1275 |
7 | EE | Naran Sirisantana,
Bipul Chandra Paul,
Kaushik Roy:
Enhancing Yield at the End of the Technology Roadmap.
IEEE Design & Test of Computers 21(6): 563-571 (2004) |
2002 |
6 | EE | Bipul Chandra Paul,
Kaushik Roy:
Testing CrossTalk Induced Delay Faults in Static CMOS Circuits Through Dynamic Timing Analysis.
ITC 2002: 384-390 |
5 | EE | Seung Hoon Choi,
Bipul Chandra Paul,
Kaushik Roy:
Dynamic Noise Analysis with Capacitive and Inductive Coupling.
VLSI Design 2002: 65-70 |
2001 |
4 | EE | Bipul Chandra Paul,
Seung Hoon Choi,
Yonghee Im,
Kaushik Roy:
Design Verification and Robust Design Technique for Cross-Talk Faults.
Asian Test Symposium 2001: 449- |
3 | EE | Hendrawan Soeleman,
Kaushik Roy,
Bipul Chandra Paul:
Sub-Domino Logic: Ultra-Low Power Dynamic Sub-Threshold Digital Logic.
VLSI Design 2001: 211-214 |
2 | EE | Hendrawan Soeleman,
Kaushik Roy,
Bipul Chandra Paul:
Robust subthreshold logic for ultra-low power operation.
IEEE Trans. VLSI Syst. 9(1): 90-99 (2001) |
2000 |
1 | EE | Hendrawan Soeleman,
Kaushik Roy,
Bipul Chandra Paul:
Robust ultra-low power sub-threshold DTMOS logic.
ISLPED 2000: 25-30 |