9. IOLTS 2003:
Kos Island,
Greece
9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece.
IEEE Computer Society 2003, ISBN 0-7695-1968-7 BibTeX
@proceedings{DBLP:conf/iolts/2003,
title = {9th IEEE International On-Line Testing Symposium (IOLTS 2003),
7-9 July 2003, Kos Island, Greece},
booktitle = {IOLTS},
publisher = {IEEE Computer Society},
year = {2003},
isbn = {0-7695-1968-7},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Keynote Talks
On-Line Testing Approaches
Self Checking Circuits
Checker Designs
Fault Tolerance
How Can Defect-Based Test Be Made to Work in a Foundry World?
Analysis and Modelling of Transient and Delay Faults
Analysis and Verification of FPGA Faults
- Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori:
Analyzing SEU Effects in SRAM-based FPGAs.
119-123
Electronic Edition (link) BibTeX
- Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell:
Defect Analysis for Delay-Fault BIST in FPGAs.
124-128
Electronic Edition (link) BibTeX
- Monica Alderighi, Sergio D'Angelo, Marcello Mancini, Giacomo R. Sechi:
A Fault Injection Tool for SRAM-based FPGAs.
129-
Electronic Edition (link) BibTeX
On-Line Testing of Microprocessor-Based Systems
Posters
- Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
On Compaction-Based Concurrent Error Detection.
157
Electronic Edition (link) BibTeX
- Victor Varshavsky, Ilya Levin, Vladimir Ostrovsky:
Increasing Implementability of beta-driven Threshold Checkers.
158
Electronic Edition (link) BibTeX
- O. Goloubeva, Matteo Sonza Reorda, Massimo Violante:
An RT-level Concurrent Error Detection Technique for Data Dominated Systems.
159
Electronic Edition (link) BibTeX
- Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, I. Solcia, Luca Tagliaferri:
FAUST: FAUlt-injection Script-based Tool.
160
Electronic Edition (link) BibTeX
- S. R. Seward, Parag K. Lala:
Fault Injection in Digital Logic Circuits at the VHDL Level.
161
Electronic Edition (link) BibTeX
- Monica Alderighi, Fabio Casini, Sergio D'Angelo, F. Faure, Marcello Mancini, Sandro Pastore, Giacomo R. Sechi, Raoul Velazco:
Radiation test methodology for SRAM-based FPGAs by using THESIC.
162
Electronic Edition (link) BibTeX
- Fabian Vargas, Diogo B. Brum, Dárcio Prestes, Leticia Maria Veiras Bolzani, Eduardo Luis Rhod, Matteo Sonza Reorda:
Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy?
163
Electronic Edition (link) BibTeX
- Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems.
164-165
Electronic Edition (link) BibTeX
- N. Venkateswaran, V. Balaji, Venkataraman Mahalingam, T. L. Rajaprabhu:
Analysis of Bit Transition Count for EDAC Encoded FSM.
166
Electronic Edition (link) BibTeX
- Rodrigo Picos, Joan Font, Eugeni Isern, Miquel Roca, Eugenio García:
A Configurable Built in Current Sensor for Mixed Signal Circuit Testing.
167
Electronic Edition (link) BibTeX
- Andrzej Krasniewski:
Evaluation of the Quality of Testing Path Delay Faults under Restricted Input Assumption.
168-
Electronic Edition (link) BibTeX
Merging On-Line and Off-Line Testing
When Will Soft Errors Become A Design Constraint?
Advanced Testing and Repair Issues
Copyright © Sat May 16 23:24:15 2009
by Michael Ley (ley@uni-trier.de)
