2008 |
20 | EE | Nektarios Kranitis,
Andreas Merentitis,
George Theodorou,
Antonis M. Paschalis,
Dimitris Gizopoulos:
Hybrid-SBST Methodology for Efficient Testing of Processor Cores.
IEEE Design & Test of Computers 25(1): 64-75 (2008) |
2007 |
19 | EE | Andreas Merentitis,
Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos:
Selecting Power-Optimal SBST Routines for On-Line Processor Testing.
European Test Symposium 2007: 111-116 |
2006 |
18 | EE | Nektarios Kranitis,
Andreas Merentitis,
N. Laoutaris,
George Theodorou,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Constantin Halatsis:
Optimal periodic testing of intermittent faults in embedded pipelined processor applications.
DATE 2006: 65-70 |
17 | EE | P. Kenterlis,
Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Mihalis Psarakis:
A Low-Cost SEU Fault Emulation Platform for SRAM-Based FPGAs.
IOLTS 2006: 235-241 |
2005 |
16 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
George Xenoulis:
Software-Based Self-Testing of Embedded Processors.
IEEE Trans. Computers 54(4): 461-475 (2005) |
15 | EE | Ioannis Voyiatzis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Nektarios Kranitis,
Constantin Halatsis:
A concurrent built-in self-test architecture based on a self-testing RAM.
IEEE Transactions on Reliability 54(1): 69-78 (2005) |
2003 |
14 | EE | Nektarios Kranitis,
George Xenoulis,
Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
Low-Cost Software-Based Self-Testing of RISC Processor Cores.
DATE 2003: 10714-10719 |
13 | EE | George Xenoulis,
Dimitris Gizopoulos,
Nektarios Kranitis,
Antonis M. Paschalis:
Low-Cost, On-Line Software-Based Self-Testing of Embedded Processor Cores.
IOLTS 2003: 149- |
12 | EE | Nektarios Kranitis,
George Xenoulis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Yervant Zorian:
Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores.
ITC 2003: 431-440 |
11 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Yervant Zorian:
Instruction-Based Self-Testing of Processor Cores.
J. Electronic Testing 19(2): 103-112 (2003) |
2002 |
10 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Yervant Zorian:
Effective Software Self-Test Methodology for Processor Cores.
DATE 2002: 592-597 |
9 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Yervant Zorian:
Instruction-Based Self-Testing of Processor Cores.
VTS 2002: 223-228 |
2001 |
8 | EE | Antonis M. Paschalis,
Dimitris Gizopoulos,
Nektarios Kranitis,
Mihalis Psarakis,
Yervant Zorian:
Deterministic software-based self-testing of embedded processor cores.
DATE 2001: 92-96 |
7 | EE | Nektarios Kranitis,
Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths.
ISQED 2001: 343-349 |
6 | EE | Mihalis Psarakis,
Antonis M. Paschalis,
Nektarios Kranitis,
Dimitris Gizopoulos,
Yervant Zorian:
Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers.
VTS 2001: 15-21 |
5 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Mihalis Psarakis,
Yervant Zorian:
An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths.
J. Electronic Testing 17(2): 97-107 (2001) |
2000 |
4 | EE | Dimitris Gizopoulos,
Nektarios Kranitis,
Mihalis Psarakis,
Antonis M. Paschalis,
Yervant Zorian:
Effective Low Power BIST for Datapaths.
DATE 2000: 757 |
3 | EE | Dimitris Gizopoulos,
Nektarios Kranitis,
Mihalis Psarakis,
Antonis M. Paschalis,
Yervant Zorian:
Low Power/Energy BIST Scheme for Datapaths.
VTS 2000: 23-28 |
2 | EE | Nektarios Kranitis,
Dimitris Gizopoulos,
Antonis M. Paschalis,
Mihalis Psarakis,
Yervant Zorian:
Power-/Energy Efficient BIST Schemes for Processor Data Paths.
IEEE Design & Test of Computers 17(4): 15-28 (2000) |
1999 |
1 | EE | Antonis M. Paschalis,
Nektarios Kranitis,
Mihalis Psarakis,
Dimitris Gizopoulos,
Yervant Zorian:
An Effective BIST Architecture for Fast Multiplier Cores.
DATE 1999: 117-121 |