2008 |
6 | EE | Eduardo Luis Rhod,
Mateus B. Rutzig,
Luigi Carro:
Binary translation process to optimize nanowire arrays usage.
ISCAS 2008: 396-399 |
5 | EE | Eduardo Luis Rhod,
Luigi Carro:
An efficient test and characterization approach for nanowire-based architectures.
SBCCI 2008: 34-39 |
4 | EE | Eduardo Luis Rhod,
Carlos Arthur Lang Lisbôa,
Luigi Carro,
Matteo Sonza Reorda,
Massimo Violante:
Hardware and Software Transparency in the Protection of Programs Against SEUs and SETs.
J. Electronic Testing 24(1-3): 45-56 (2008) |
2007 |
3 | EE | Eduardo Luis Rhod,
Carlos Arthur Lang Lisbôa,
Luigi Carro:
A low-SER efficient core processor architecture for future technologies.
DATE 2007: 1448-1453 |
2004 |
2 | EE | Fabian Vargas,
Rubem Dutra Ribeiro Fagundes,
Daniel Barros Jr.,
Diogo B. Brum,
Eduardo Luis Rhod:
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems.
J. Electronic Testing 20(4): 397-411 (2004) |
2003 |
1 | EE | Fabian Vargas,
Diogo B. Brum,
Dárcio Prestes,
Leticia Maria Veiras Bolzani,
Eduardo Luis Rhod,
Matteo Sonza Reorda:
Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy?
IOLTS 2003: 163 |