| |
| 2005 | ||
|---|---|---|
| 2 | EE | Robert Baumann: Soft Errors in Advanced Computer Systems. IEEE Design & Test of Computers 22(3): 258-266 (2005) |
| 2003 | ||
| 1 | EE | Robert Baumann: Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices. IOLTS 2003: 4- |