| 2005 |
|---|
| 7 | EE | Michael Nicolaidis,
Lorena Anghel,
Nadir Achouri:
Memory Defect Tolerance Architectures for Nanotechnologies.
J. Electronic Testing 21(4): 445-455 (2005) |
| 2004 |
|---|
| 6 | EE | Lorena Anghel,
Nadir Achouri,
Michael Nicolaidis:
Evaluation of Memory Built-in Self Repair Techniques for High Defect Density Technologie.
PRDC 2004: 315-320 |
| 5 | EE | Michael Nicolaidis,
Nadir Achouri,
Lorena Anghel:
A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies.
VTS 2004: 313-318 |
| 2003 |
|---|
| 4 | EE | Michael Nicolaidis,
Nadir Achouri,
Slimane Boutobza:
Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair.
DATE 2003: 10590-10595 |
| 3 | EE | Michael Nicolaidis,
Nadir Achouri,
Lorena Anghel:
A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities.
DFT 2003: 459-466 |
| 2 | EE | Michael Nicolaidis,
Nadir Achouri,
Slimane Boutobza:
Dynamic Data-bit Memory Built-In Self- Repair.
ICCAD 2003: 588-594 |
| 1 | EE | Michael Nicolaidis,
Nadir Achouri,
Lorena Anghel:
Memory Built-In Self-Repair for Nanotechnologies.
IOLTS 2003: 94- |
