| 2006 |
|---|
| 3 | EE | Frank Poehl,
Jan Rzeha,
Matthias Beck,
Michael Gössel,
Ralf Arnold,
Peter Ossimitz:
On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture.
European Test Symposium 2006: 239-246 |
| 2003 |
|---|
| 2 | EE | Frank Poehl,
Matthias Beck,
Ralf Arnold,
Peter Muhmenthaler,
Nagesh Tamarapalli,
Mark Kassab,
Nilanjan Mukherjee,
Janusz Rajski:
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions.
ITC 2003: 1211-1220 |
| 1997 |
|---|
| 1 | | Ralf Arnold,
Markus Feuser,
Horst-Udo Wedekind,
Thorsten Bode:
Experiences with Implementation of IDDQ Test for Identification and Automotive Products.
ITC 1997: 127-135 |
