| 2006 |
|---|
| 5 | EE | Achraf Dhayni,
Salvador Mir,
Libor Rufer,
Ahcène Bounceur:
Pseudorandom functional BIST for linear and nonlinear MEMS.
DATE 2006: 664-669 |
| 4 | EE | Salvador Mir,
Libor Rufer,
Achraf Dhayni:
Built-in-self-test techniques for MEMS.
Microelectronics Journal 37(12): 1591-1597 (2006) |
| 2005 |
|---|
| 3 | EE | Achraf Dhayni,
Salvador Mir,
Libor Rufer,
Ahcène Bounceur:
On-chip Pseudorandom Testing for Linear and Nonlinear MEMS.
VLSI-SoC 2005: 245-266 |
| 2 | EE | Libor Rufer,
Salvador Mir,
Emmanuel Simeu,
C. Domingues:
On-Chip Pseudorandom MEMS Testing.
J. Electronic Testing 21(3): 233-241 (2005) |
| 2004 |
|---|
| 1 | EE | Salvador Mir,
Libor Rufer,
Bernard Courtois:
On-chip testing of embedded transducers.
VLSI Design 2004: 463- |
