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| 1995 | ||
|---|---|---|
| 3 | EE | Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189- |
| 1988 | ||
| 2 | EE | Sudipta Bhawmik, P. Pal Chaudhuri: DFTEXPERT: An Expert System for Design of Testable VLSI Circuits. IEA/AIE (Vol. 1) 1988: 388-396 |
| 1986 | ||
| 1 | J. S. R. Subrahmanyam, P. Pal Chaudhuri: A Divide and Conquer Testing Strategy for Detection of Multiple Faults by SFDTS. ITC 1986: 997-1006 | |
| 1 | Vishwani D. Agrawal | [3] |
| 2 | Sudipta Bhawmik | [2] |
| 3 | Bernard Courtois | [3] |
| 4 | Fumiyasu Hirose | [3] |
| 5 | Sandip Kundu | [3] |
| 6 | Chung-Len Lee | [3] |
| 7 | Yinghua Min | [3] |
| 8 | J. S. R. Subrahmanyam | [1] |