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P. Pal Chaudhuri

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1995
3EEVishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189-
1988
2EESudipta Bhawmik, P. Pal Chaudhuri: DFTEXPERT: An Expert System for Design of Testable VLSI Circuits. IEA/AIE (Vol. 1) 1988: 388-396
1986
1 J. S. R. Subrahmanyam, P. Pal Chaudhuri: A Divide and Conquer Testing Strategy for Detection of Multiple Faults by SFDTS. ITC 1986: 997-1006

Coauthor Index

1Vishwani D. Agrawal [3]
2Sudipta Bhawmik [2]
3Bernard Courtois [3]
4Fumiyasu Hirose [3]
5Sandip Kundu [3]
6Chung-Len Lee [3]
7Yinghua Min [3]
8J. S. R. Subrahmanyam [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)