ITC 1981:
Philadelphia,
PA,
USA
Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981.
IEEE Computer Society 1981 BibTeX
@proceedings{DBLP:conf/itc/1981,
title = {Proceedings International Test Conference 1981, Philadelphia,
PA, USA, October 1981},
booktitle = {ITC},
publisher = {IEEE Computer Society},
year = {1981},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Session 1:
Keynote Address and Invited Panel
Session 2:
Microprocessor Testing and Modeling
Session 3:
Memory Test
- Robert G. Dunn, A. Kwan, David P. Rodgers, D. Sandstrom, C. Sie:
System to Optimize Test Quality and Efficiency for Memories and LSI.
31-37 BibTeX
- E. Kurzweil, L. Jambut:
Importance of Asynchronous Refreshing in Memory Testing.
38-43 BibTeX
- Steven Winegarden, Donald Pannell:
Paragons for Memory Test.
44-48 BibTeX
- Robert C. Evans:
Testing Repairable RAMs and Mostly Good Memories.
49-55 BibTeX
- Joan M. Morrissey, Ching-Hua Chow, Ronald C. Devries, C. Megivern:
An Approach to Memory Testing, Diagnostics and Analysis.
56-67 BibTeX
- G. K. Lukianoff, J. S. Wolcott, Joan M. Morrissey:
Electron-Beam Testing of VLSI Dyrnamic RAMs.
68-78 BibTeX
Session 4:
Design and Testability
Session 7:
Test Equipment and Methods
Session 8:
CODEC Testing
Session 9:
Design for Testability/Self Test II
Session 10:
Board Testing
Session 11:
Precision Measurement,
Calibration and Testing
Session 12:
Test Economics
Session 13:
Test System Architecture
Session 14:
System Testing in the Field
Session 15:
Functional Testing
Session 16:
Software
Session 17:
System Testing in Manufacturing
Session 18:
Testing Valuation and Fault Coverage
Copyright © Sat May 16 23:26:39 2009
by Michael Ley (ley@uni-trier.de)
