| |
| 1990 | ||
|---|---|---|
| 2 | René David, Antoine Fuentes: Fault Diagnosis of RAM's from Random Testing Experiments. IEEE Trans. Computers 39(2): 220-229 (1990) | |
| 1989 | ||
| 1 | René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989) | |
| 1 | Bernard Courtois | [1] |
| 2 | René David | [1] [2] |