| 1999 |
|---|
| 9 | | K. Liateni,
D. Moulinier,
B. Affour,
A. Delpoux,
Jean-Michel Karam:
Moving MEMS into Mainstream Applications: The MEMSCAP Solution.
VLSI 1999: 544-556 |
| 8 | | Bernard Courtois,
Jean-Michel Karam,
Salvador Mir,
Marcelo Lubaszewski,
Vladimir Székely,
Márta Rencz,
Klaus Hofmann,
Manfred Glesner:
Design and Test of MEMs.
VLSI Design 1999: 270- |
| 1998 |
|---|
| 7 | EE | A. Castillejo,
D. Veychard,
Salvador Mir,
Jean-Michel Karam,
Bernard Courtois:
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems.
ITC 1998: 541-550 |
| 6 | EE | Jean-Michel Karam,
Marcelo Lubaszewski,
S. Blanton,
Andrew Richardson:
Testing MEMS.
VTS 1998: 320-321 |
| 5 | EE | Vladimir Székely,
Márta Rencz,
Jean-Michel Karam,
Marcelo Lubaszewski,
Bernard Courtois:
Thermal Monitoring of Self-Checking Systems.
J. Electronic Testing 12(1-2): 81-92 (1998) |
| 1997 |
|---|
| 4 | EE | Jean-Michel Karam,
Bernard Courtois,
Hicham Boutamine,
P. Drake,
András Poppe,
Vladimir Székely,
Márta Rencz,
Klaus Hofmann,
Manfred Glesner:
CAD and Foundries for Microsystems.
DAC 1997: 674-679 |
| 3 | EE | Klaus Hofmann,
Manfred Glesner,
Nicu Sebe,
A. Manolescu,
Santiago Marco,
Josep Samitier,
Jean-Michel Karam,
Bernard Courtois:
Generation of the HDL-A-model of a micromembrane from its finite-element-description.
ED&TC 1997: 108-112 |
| 2 | EE | Jean-Michel Karam,
Bernard Courtois,
Hicham Boutamine:
CAD Tools for Bridging Microsystems and Foundries.
IEEE Design & Test of Computers 14(2): 34-39 (1997) |
| 1996 |
|---|
| 1 | EE | Vladimir Székely,
Márta Rencz,
Jean-Michel Karam,
Marcelo Lubaszewski,
Bernard Courtois:
Thermal Monitoring Of Safety-Critical Integrated Systems.
Asian Test Symposium 1996: 282-288 |
