| |
| 2000 | ||
|---|---|---|
| 1 | EE | Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000) |
| 1 | Bernard Courtois | [1] |
| 2 | Márta Rencz | [1] |
| 3 | Vladimir Székely | [1] |
| 4 | Kholdoun Torki | [1] |