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3. DELTA 2006: Kuala Lumpur, Malaysia

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia. IEEE Computer Society 2006, ISBN 0-7695-2500-8 BibTeX



Session 1A: Special Session on Diagnostic in Deep Submicron Technologies

Session 1B: Analog Components and Design Techniques

Session 2A: Image and Video Processing

Session 2B: Special Session on Industrial and Practical Test Engineering

Poster Session 1

Session 3A: Special Session on Electronics Education

Session 3B: Synthesis and Logic Optimization

Session 4A: Special Session on Electromagnetic Sensors & Devices 1

Session 4B: Fault Modelling

Poster Session 2

Session 5A: Processor Design and Analysis

Session 5B: Novel Systems and Applications

Session 6A: Innovations in Test

Session 6B: Special Session on Microphotonics

Poster Session 3

Session 7A: Special Session on Electromagnetic Sensors & Devices 2

Session 7B: BIST and Memory Test

Poster Session 4

Session 8A: Special Session on Defect and Fault Tolerance in Electronic Systems

Session 8B: Signal Processing

Session 9A: Design Verification and Concurrent Checking

Session 9B: Communications and Networking

Copyright © Sat May 16 23:06:24 2009 by Michael Ley (ley@uni-trier.de)