Melanie Po-Leen Ooi

List of publications from the DBLP Bibliography Server - FAQ

2008

4 EE Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko: Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. DELTA 2008: 216-221

2006

3 EE Melanie Po-Leen Ooi: Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space. DELTA 2006: 41-46

2 EE Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko: Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. IEEE Design & Test of Computers 23(2): 88-98 (2006)

2005

1 EE Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko: Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. Asian Test Symposium 2005: 472

2008
4	EE	Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko: Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. DELTA 2008: 216-221
2006
3	EE	Melanie Po-Leen Ooi: Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space. DELTA 2006: 41-46
2	EE	Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko: Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. IEEE Design & Test of Computers 23(2): 88-98 (2006)
2005
1	EE	Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko: Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. Asian Test Symposium 2005: 472

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