Lew Boon Kian
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2006
1
EE
Lew Boon Kian: Test Cost Saving and Challenges in the Implementation of x6 and x8 Parallel Testing on Freescale 16-bit HCS12 Micro-controller Product Family.
DELTA 2006
: 74-82
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)