| 2007 |
| 9 | EE | Vincent Kerzerho,
Philippe Cauvet,
Serge Bernard,
Florence Azaïs,
Mariane Comte,
Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.
European Test Symposium 2007: 211-216 |
| 2006 |
| 8 | EE | Mariane Comte,
Satoshi Ohtake,
Hideo Fujiwara,
Michel Renovell:
Electrical Behavior of GOS Fault affected Domino Logic Cell.
DELTA 2006: 183-189 |
| 7 | EE | Vincent Kerzerho,
Philippe Cauvet,
Serge Bernard,
Florence Azaïs,
Mariane Comte,
Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.
European Test Symposium 2006: 159-164 |
| 6 | EE | Vincent Kerzerho,
Philippe Cauvet,
Serge Bernard,
Florence Azaïs,
Mariane Comte,
Michel Renovell:
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs.
IEEE Design & Test of Computers 23(3): 234-243 (2006) |
| 2005 |
| 5 | EE | Florence Azaïs,
Serge Bernard,
Yves Bertrand,
Mariane Comte,
Michel Renovell:
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications.
J. Electronic Testing 21(3): 291-298 (2005) |
| 2004 |
| 4 | EE | Serge Bernard,
Mariane Comte,
Florence Azaïs,
Yves Bertrand,
Michel Renovell:
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors.
J. Electronic Testing 20(3): 257-267 (2004) |
| 3 | EE | Florence Azaïs,
Serge Bernard,
Yves Bertrand,
Mariane Comte,
Michel Renovell:
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure.
J. Electronic Testing 20(4): 375-387 (2004) |
| 2003 |
| 2 | EE | Serge Bernard,
Mariane Comte,
Florence Azaïs,
Yves Bertrand,
Michel Renovell:
A New Methodology For ADC Test Flow Optimization.
ITC 2003: 201-209 |
| 1 | EE | Florence Azaïs,
Serge Bernard,
Yves Bertrand,
Mariane Comte,
Michel Renovell:
A-to-D converters static error detection from dynamic parameter measurement.
Microelectronics Journal 34(10): 945-953 (2003) |