2007 | ||
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2 | EE | Hongfei Liu, Alin Hou, Hongbo Zhang, Daming Zhang, Maobin Yi: A voltage calibration technique of electro-optic probing for characterization internal to IC's chip. Microelectronics Reliability 47(1): 82-87 (2007) |
2006 | ||
1 | EE | Daming Zhang, K. J. Tseng: Effect of High Permittivity and Core Dimensions on the Permeability Measurement for Mn-Zn Ferrite Cores Used in High-Frequency Transformer. DELTA 2006: 371-378 |
1 | Alin Hou | [2] |
2 | Hongfei Liu | [2] |
3 | K. J. Tseng | [1] |
4 | Maobin Yi | [2] |
5 | Hongbo Zhang | [2] |