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| 2007 | ||
|---|---|---|
| 2 | EE | Hongfei Liu, Alin Hou, Hongbo Zhang, Daming Zhang, Maobin Yi: A voltage calibration technique of electro-optic probing for characterization internal to IC's chip. Microelectronics Reliability 47(1): 82-87 (2007) |
| 2006 | ||
| 1 | EE | Daming Zhang, K. J. Tseng: Effect of High Permittivity and Core Dimensions on the Permeability Measurement for Mn-Zn Ferrite Cores Used in High-Frequency Transformer. DELTA 2006: 371-378 |
| 1 | Alin Hou | [2] |
| 2 | Hongfei Liu | [2] |
| 3 | K. J. Tseng | [1] |
| 4 | Maobin Yi | [2] |
| 5 | Hongbo Zhang | [2] |