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B. Sokol

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2007
3EES. V. Yarmolik, Ireneusz Mrozek, B. Sokol: Address Sequences Generation for Multiple Run Memory Testing. CISIM 2007: 341-344
2006
2 S. V. Yarmolik, B. Sokol: Optimal Memory Address Seeds for Pattern Sensitive Faults Detection. DDECS 2006: 220-221
1EEB. Sokol, S. V. Yarmolik: Address Sequences for March Tests to Detect Pattern Sensitive Faults. DELTA 2006: 354-360

Coauthor Index

1Ireneusz Mrozek [3]
2S. V. Yarmolik [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)