Le Jin

2008
12	EE	Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin: System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS 2008: 2402-2405
2007
11	EE	Le Jin, Degang Chen, Randall L. Geiger: Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310
2006
10	EE	Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger: A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS 2006
9	EE	Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger: Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS 2006
2005
8	EE	Le Jin, Degang Chen, Randall L. Geiger: A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) 2005: 1378-1381
7	EE	Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen: A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) 2005: 3809-3812
2004
6	EE	Chengming He, Le Jin, Degang Chen, Randall L. Geiger: Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) 2004: 481-484
5	EE	Le Jin, Chengming He, Degang Chen, Randall L. Geiger: An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) 2004: 928-931
4		Le Jin, Chengming He, Degang Chen, Randall L. Geiger: Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935
2003
3	EE	Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger: Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) 2003: 537-540
2	EE	Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger: Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC 2003: 218-227
1	EE	Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger: BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003)

Coauthor Index

1	Degang Chen	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12]
2	Randall L. Geiger	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12]
3	Chengming He	[4] [5] [6]
4	Turker Kuyel	[1] [2] [3]
5	Wenbo Liu	[7]
6	Kumar L. Parthasarathy	[1] [2] [3]
7	Dana Price	[1] [3]
8	Hanqing Xing	[7] [9] [10] [12]