| |
| 2003 | ||
|---|---|---|
| 4 | EE | Muhammad Nummer, Manoj Sachdev: DFT for Testing igh-Performance Pipelined Circuits with Slow-Speed Testers. DATE 2003: 10212-10217 |
| 3 | EE | Muhammad Nummer, Manoj Sachdev: Testing high-performance pipelined circuits with slow-speed testers. ACM Trans. Design Autom. Electr. Syst. 8(4): 506-521 (2003) |
| 2 | EE | Muhammad Nummer, Manoj Sachdev: A DFT Technique for Testing High-Speed Circuits with Arbitrarily Slow Testers. J. Electronic Testing 19(3): 299-314 (2003) |
| 2001 | ||
| 1 | EE | Muhammad Nummer, Manoj Sachdev: A Methodology for Testing High-Performance Circuits at Arbitrarily Low Test Frequency. VTS 2001: 68-74 |
| 1 | Manoj Sachdev | [1] [2] [3] [4] |