2003 |
7 | EE | Kumar L. Parthasarathy,
Le Jin,
Turker Kuyel,
Dana Price,
Degang Chen,
Randall L. Geiger:
Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance.
ISCAS (5) 2003: 537-540 |
6 | EE | Le Jin,
Kumar L. Parthasarathy,
Turker Kuyel,
Degang Chen,
Randall L. Geiger:
Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs.
ITC 2003: 218-227 |
5 | EE | Kumar L. Parthasarathy,
Turker Kuyel,
Dana Price,
Le Jin,
Degang Chen,
Randall L. Geiger:
BIST and production testing of ADCs using imprecise stimulus.
ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003) |
2000 |
4 | | Turker Kuyel,
Frank Tsay:
Optimal analog trim techniques for improving the linearity of pipeline ADCs.
ITC 2000: 367-375 |
1999 |
3 | | Turker Kuyel:
Linearity testing issues of analog to digital converters.
ITC 1999: 747-756 |
2 | | Turker Kuyel,
Haydar Bilhan:
Relating linearity test results to design flaws of pipelined analog to digital converters.
ITC 1999: 772-779 |
1 | | Turker Kuyel,
Wilson S. Geisler,
Joydeep Ghosh:
Fast image classification using a sequence of visual fixations.
IEEE Transactions on Systems, Man, and Cybernetics, Part B 29(2): 304-308 (1999) |