| 2004 |
|---|
| 12 | EE | Dirk Niggemeyer,
Elizabeth M. Rudnick:
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing.
IEEE Trans. Computers 53(9): 1134-1146 (2004) |
| 2003 |
|---|
| 11 | EE | Dirk Niggemeyer,
Elizabeth M. Rudnick:
A data acquisition methodology for on-chip repair of embedded memories.
ACM Trans. Design Autom. Electr. Syst. 8(4): 560-576 (2003) |
| 2001 |
|---|
| 10 | EE | Dirk Niggemeyer,
Elizabeth M. Rudnick:
Automatic Generation of Diagnostic March Tests.
VTS 2001: 299-305 |
| 2000 |
|---|
| 9 | EE | Timothy J. Bergfeld,
Dirk Niggemeyer,
Elizabeth M. Rudnick:
Diagnostic Testing of Embedded Memories Using BIST.
DATE 2000: 305- |
| 8 | EE | Dirk Niggemeyer,
Elizabeth M. Rudnick,
Michael Redeker:
Diagnostic Testing of Embedded Memories Based on Output Tracing.
MTDT 2000: 113-118 |
| 7 | EE | Michael Redeker,
Markus Rudack,
Thomas Lobbe,
Dirk Niggemeyer:
Using GLFSRs for Pseudo-Random Memory BIST.
MTDT 2000: 85-94 |
| 1999 |
|---|
| 6 | EE | Dirk Niggemeyer,
M. Rüffer:
Parametric Built-In Self-Test of VLSI Systems.
DATE 1999: 376- |
| 5 | EE | Markus Rudack,
Dirk Niggemeyer:
Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM.
DFT 1999: 31-39 |
| 1998 |
|---|
| 4 | EE | Jörg Hilgenstock,
Klaus Herrmann,
Jan Otterstedt,
Dirk Niggemeyer,
Peter Pirsch:
A Video Signal Processor for MIMD Multiprocessing.
DAC 1998: 50-55 |
| 3 | EE | Petra Nordholz,
Hartmut Grabinski,
Dieter Treytnar,
Jan Otterstedt,
Dirk Niggemeyer,
Uwe Arz,
T. W. Williams:
Core Interconnect Testing Hazards.
DATE 1998: 953-954 |
| 2 | EE | Jan Otterstedt,
Dirk Niggemeyer,
T. W. Williams:
Detection of CMOS address decoder open faults with March and pseudo random memory tests.
ITC 1998: 53-62 |
| 1 | EE | Petra Nordholz,
Dieter Treytnar,
Jan Otterstedt,
Hartmut Grabinski,
Dirk Niggemeyer,
T. W. Williams:
Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores.
VTS 1998: 28-33 |
