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Ali Keshavarzi

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2008
31 Vijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle: Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008 ACM 2008
2007
30 Diana Marculescu, Anand Raghunathan, Ali Keshavarzi, Vijaykrishnan Narayanan: Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007 ACM 2007
29EEJosé Luis Rosselló, Vicens Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura: A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs CoRR abs/0710.4759: (2007)
2006
28EESebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura: Impact of Thermal Gradients on Clock Skew and Testing. IEEE Design & Test of Computers 23(5): 414-424 (2006)
2005
27EEJosé Luis Rosselló, Vicens Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura: A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs. DATE 2005: 206-211
26EEJames Tschanz, Siva Narendra, Ali Keshavarzi, Vivek De: Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power. ISCAS (1) 2005: 9-12
25EEAli Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De: Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. ISLPED 2005: 26-29
24EEAbhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay: Test Methodologies in the Deep Submicron Era -- Analog, Mixed-Signal, and RF. VLSI Design 2005: 12-13
2004
23EEArman Vassighi, Ali Keshavarzi, Siva Narendra, Gerhard Schrom, Yibin Ye, Seri Lee, Greg Chrysler, Manoj Sachdev, Vivek De: Design optimizations for microprocessors at low temperature. DAC 2004: 2-5
22EEBhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi: A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. ITC 2004: 1108-1117
21EESebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi: Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. ITC 2004: 1276-1284
20EEBhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi: DFT for Delay Fault Testing of High-Performance Digital Circuits. IEEE Design & Test of Computers 21(3): 248-258 (2004)
2003
19EEShekhar Borkar, Tanay Karnik, Siva Narendra, James Tschanz, Ali Keshavarzi, Vivek De: Parameter variations and impact on circuits and microarchitecture. DAC 2003: 338-342
18EECharles F. Hawkins, Ali Keshavarzi, Jaume Segura: A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. DFT 2003: 267-
17EEArman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi: Thermal Management of High Performance Microprocessors. DFT 2003: 313-319
16EEB. Alorda, B. Bloechel, Ali Keshavarzi, Jaume Segura: CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. ITC 2003: 719-726
15EEOleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins: Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC 2003: 95-104
14EEAli Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De: Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. IEEE Trans. VLSI Syst. 11(5): 863-870 (2003)
2002
13EEArman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi: Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. DFT 2002: 12-19
12EEBhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi: A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits. ITC 2002: 1130-1139
11EEJaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins: Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC 2002: 90-99
10EEJaume Segura, Vivek De, Ali Keshavarzi: Challenges in Nanometric Technology Scaling: Trends and Projections. VTS 2002: 447-448
9EEZhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy: IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions. IEEE Design & Test of Computers 19(2): 24-33 (2002)
8EEAli Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins: Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Design & Test of Computers 19(5): 36-43 (2002)
7EEFatih Hamzaoglu, Yibin Ye, Ali Keshavarzi, Kevin Zhang, Siva Narendra, Shekhar Borkar, Mircea R. Stan, Vivek De: Analysis of dual-VT SRAM cells with full-swing single-ended bit line sensing for on-chip cache. IEEE Trans. VLSI Syst. 10(2): 91-95 (2002)
2001
6EEAli Keshavarzi, Sean Ma, Siva Narendra, B. Bloechel, K. Mistry, T. Ghani, Shekhar Borkar, Vivek De: Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs. ISLPED 2001: 207-212
5EEKaushik Roy, Ali Keshavarzi: Design and Test of Low Voltage CMOS Circuits. ISQED 2001: 7
2000
4 Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, K. Soumyanath, Vivek De: Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC 2000: 1051-1059
3EEAli Keshavarzi, Kaushik Roy, Charles F. Hawkins: Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. VLSI Syst. 8(6): 717-723 (2000)
1999
2EEAli Keshavarzi, Siva Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De: Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. ISLPED 1999: 252-254
1997
1 Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins: Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. ITC 1997: 146-155

Coauthor Index

1B. Alorda [16]
2Carol de Benito [28]
3B. Bloechel [6] [16]
4Shekhar Y. Borkar (Shekhar Borkar) [2] [6] [7] [19]
5Sebastià A. Bota [21] [27] [28] [29]
6Keith A. Bowman [25]
7John Brews [25]
8Vicens Canals [27] [29]
9Abhijit Chatterjee [24]
10Bhaskar Chatterjee [12] [20] [22]
11Zhanping Chen [9]
12Greg Chrysler [23]
13W. Robert Daasch [8]
14Vivek De [2] [4] [6] [7] [8] [10] [14] [19] [23] [25] [26]
15Steven G. Duvall [25]
16T. Ghani [6]
17Nagib Hakim [25]
18Fatih Hamzaoglu [7]
19Charles F. Hawkins [1] [2] [3] [4] [8] [11] [14] [15] [18]
20Jörg Henkel [31]
21Tanay Karnik [19]
22Seri Lee [23]
23Tom Linton [25]
24Sean Ma [6] [25]
25Diana Marculescu [30]
26K. Mistry [6]
27Siddhartha Mukhopadhyay [24]
28Siva Narendra [2] [6] [7] [8] [19] [23] [26]
29Vojin G. Oklobdzija [31]
30Barry M. Pangrle [31]
31Amit Patra [24]
32Anand Raghunathan [30]
33C. P. Ravikumar [31]
34M. Rosales [21]
35José Luis Rosselló [21] [27] [28] [29]
36Kaushik Roy [1] [2] [3] [4] [5] [8] [9] [14]
37Manoj Sachdev [4] [8] [12] [13] [15] [17] [20] [22] [23]
38Gerhard Schrom [23] [25]
39Jaume Segura [10] [11] [16] [18] [21] [27] [28] [29]
40Oleg Semenov [13] [15] [17]
41Jerry M. Soden [11]
42K. Soumyanath [4]
43Mircea R. Stan [7]
44Stephen Tang [25]
45James Tschanz [8] [19] [26]
46Sunit Tyagi [25]
47Arman Vassighi [13] [15] [17] [23]
48Narayanan Vijaykrishnan (Vijaykrishnan Narayanan) [30] [31]
49Liqiong Wei [9]
50Yibin Ye [7] [23]
51Kevin Zhang [7] [25]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)