2005 | ||
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1 | EE | Ali Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De: Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. ISLPED 2005: 26-29 |
1 | Keith A. Bowman | [1] |
2 | John Brews | [1] |
3 | Vivek De | [1] |
4 | Steven G. Duvall | [1] |
5 | Nagib Hakim | [1] |
6 | Ali Keshavarzi | [1] |
7 | Tom Linton | [1] |
8 | Sean Ma | [1] |
9 | Gerhard Schrom | [1] |
10 | Stephen Tang | [1] |
11 | Kevin Zhang | [1] |