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Carol de Benito

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2007
4EEJosé Luis Rosselló, Carol de Benito, Sebastià A. Bota, Jaume Segura: Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs. DATE 2007: 1271-1276
2006
3EEJosé Luis Rosselló, Carol de Benito, Sebastià A. Bota, Jaume Segura: Leakage Power Characterization Considering Process Variations. PATMOS 2006: 66-74
2EESebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura: Impact of Thermal Gradients on Clock Skew and Testing. IEEE Design & Test of Computers 23(5): 414-424 (2006)
1995
1 Jaume Segura, Carol de Benito, A. Rubio, Charles F. Hawkins: A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. ITC 1995: 544-551

Coauthor Index

1Sebastià A. Bota [2] [3] [4]
2Charles F. Hawkins [1]
3Ali Keshavarzi [2]
4José Luis Rosselló [2] [3] [4]
5A. Rubio [1]
6Jaume Segura [1] [2] [3] [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)