| 2005 |
|---|
| 3 | EE | Ali Keshavarzi,
Gerhard Schrom,
Stephen Tang,
Sean Ma,
Keith A. Bowman,
Sunit Tyagi,
Kevin Zhang,
Tom Linton,
Nagib Hakim,
Steven G. Duvall,
John Brews,
Vivek De:
Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage.
ISLPED 2005: 26-29 |
| 2001 |
|---|
| 2 | EE | Yung-Huei Lee,
Tom Linton,
Ken Wu,
Neal Mielke:
Effect of trench edge on pMOSFET reliability.
Microelectronics Reliability 41(5): 689-696 (2001) |
| 1991 |
|---|
| 1 | | Tom Linton:
Countable Structures, Ehrenfeucht Stratagies, and Wadge Reductions.
J. Symb. Log. 56(4): 1325-1348 (1991) |
