2005 |
5 | EE | Ali Keshavarzi,
Gerhard Schrom,
Stephen Tang,
Sean Ma,
Keith A. Bowman,
Sunit Tyagi,
Kevin Zhang,
Tom Linton,
Nagib Hakim,
Steven G. Duvall,
John Brews,
Vivek De:
Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage.
ISLPED 2005: 26-29 |
1995 |
4 | EE | Steven G. Duvall:
A practical methodology for the statistical design of complex logic products for performance.
IEEE Trans. VLSI Syst. 3(1): 112-123 (1995) |
1993 |
3 | EE | Steven G. Duvall:
Practical Statistical Design of Complex Integrated Circuit Products.
DAC 1993: 561-565 |
1988 |
2 | EE | Steven G. Duvall:
An interchange format for process and device simulation.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(7): 741-754 (1988) |
1987 |
1 | EE | J. Mar,
Krish Bhargavan,
Steven G. Duvall,
Ram Firestone,
Dennis J. Lucey,
S. N. Nandgaonkar,
S. Wu,
Kaung-Shia Yu,
F. Zarbakhsh:
EASE--An Application-Based CAD System for Process Design.
IEEE Trans. on CAD of Integrated Circuits and Systems 6(6): 1032-1038 (1987) |