| 2006 |
|---|
| 6 | EE | Oleg Semenov,
H. Sarbishaei,
Valery Axelrad,
Manoj Sachdev:
Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices.
Microelectronics Journal 37(6): 526-533 (2006) |
| 2005 |
|---|
| 5 | EE | Oleg Semenov,
H. Sarbishaei,
Manoj Sachdev:
Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment.
ISQED 2005: 427-432 |
| 2003 |
|---|
| 4 | EE | Arman Vassighi,
Oleg Semenov,
Manoj Sachdev,
Ali Keshavarzi:
Thermal Management of High Performance Microprocessors.
DFT 2003: 313-319 |
| 3 | EE | Oleg Semenov,
Arman Vassighi,
Manoj Sachdev,
Ali Keshavarzi,
Charles F. Hawkins:
Burn-in Temperature Projections for Deep Sub-micron Technologies.
ITC 2003: 95-104 |
| 2 | EE | Oleg Semenov,
Arman Vassighi,
Manoj Sachdev:
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing.
J. Electronic Testing 19(3): 341-352 (2003) |
| 2002 |
|---|
| 1 | EE | Arman Vassighi,
Oleg Semenov,
Manoj Sachdev,
Ali Keshavarzi:
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI.
DFT 2002: 12-19 |
