| 2004 |
|---|
| 5 | EE | Arman Vassighi,
Ali Keshavarzi,
Siva Narendra,
Gerhard Schrom,
Yibin Ye,
Seri Lee,
Greg Chrysler,
Manoj Sachdev,
Vivek De:
Design optimizations for microprocessors at low temperature.
DAC 2004: 2-5 |
| 2003 |
|---|
| 4 | EE | Arman Vassighi,
Oleg Semenov,
Manoj Sachdev,
Ali Keshavarzi:
Thermal Management of High Performance Microprocessors.
DFT 2003: 313-319 |
| 3 | EE | Oleg Semenov,
Arman Vassighi,
Manoj Sachdev,
Ali Keshavarzi,
Charles F. Hawkins:
Burn-in Temperature Projections for Deep Sub-micron Technologies.
ITC 2003: 95-104 |
| 2 | EE | Oleg Semenov,
Arman Vassighi,
Manoj Sachdev:
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing.
J. Electronic Testing 19(3): 341-352 (2003) |
| 2002 |
|---|
| 1 | EE | Arman Vassighi,
Oleg Semenov,
Manoj Sachdev,
Ali Keshavarzi:
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI.
DFT 2002: 12-19 |
