| 2007 |
|---|
| 6 | EE | Sebstatià A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura:
Smart Temperature Sensor for Thermal Testing of Cell-Based ICs
CoRR abs/0710.4733: (2007) |
| 2006 |
|---|
| 5 | EE | Sebastià A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura:
Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?.
VTS 2006: 358-363 |
| 2005 |
|---|
| 4 | EE | Sebastià A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura:
Smart Temperature Sensor for Thermal Testing of Cell-Based ICs.
DATE 2005: 464-465 |
| 2004 |
|---|
| 3 | EE | Sebastià A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura,
Ali Keshavarzi:
Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism.
ITC 2004: 1276-1284 |
| 2002 |
|---|
| 2 | EE | B. Alorda,
M. Rosales,
Jerry M. Soden,
Charles F. Hawkins,
Jaume Segura:
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs.
ITC 2002: 947-953 |
| 2001 |
|---|
| 1 | EE | Ivan de Paúl,
M. Rosales,
B. Alorda,
Jaume Segura,
Charles F. Hawkins,
Jerry M. Soden:
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments.
VTS 2001: 286-291 |
