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| 2005 | ||
|---|---|---|
| 1 | EE | Ali Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De: Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. ISLPED 2005: 26-29 |
| 1 | Keith A. Bowman | [1] |
| 2 | Vivek De | [1] |
| 3 | Steven G. Duvall | [1] |
| 4 | Nagib Hakim | [1] |
| 5 | Ali Keshavarzi | [1] |
| 6 | Tom Linton | [1] |
| 7 | Sean Ma | [1] |
| 8 | Gerhard Schrom | [1] |
| 9 | Stephen Tang | [1] |
| 10 | Sunit Tyagi | [1] |
| 11 | Kevin Zhang | [1] |