2002 |
8 | EE | Michael Redeker,
Bruce F. Cockburn,
Duncan G. Elliott,
Yunan Xiang,
Sue Ann Ung:
Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM.
MTDT 2002: 117-122 |
7 | EE | Michael Redeker,
Bruce F. Cockburn,
Duncan G. Elliott:
An Investigation into Crosstalk Noise in DRAM Structures.
MTDT 2002: 123- |
6 | EE | Markus Rudack,
Michael Redeker,
Jörg Hilgenstock,
Sören Moch,
Jens Castagne:
A Large-Area Integrated Multiprocessor System for Video Applications.
IEEE Design & Test of Computers 19(1): 6-17 (2002) |
2000 |
5 | EE | Ole Mende,
Michael Redeker,
Markus Rudack,
Dieter Treytnar:
A Multifunctional Laser Linking and Cutting Structure for Standard 0.25 mum CMOS-Technology.
DFT 2000: 114- |
4 | EE | Markus Rudack,
Michael Redeker,
Dieter Treytnar,
Ole Mende,
Klaus Herrmann:
Self-Configuration of a Large Area Integrated Multiprocessor System for Video Applications.
DFT 2000: 78-86 |
3 | EE | Dirk Niggemeyer,
Elizabeth M. Rudnick,
Michael Redeker:
Diagnostic Testing of Embedded Memories Based on Output Tracing.
MTDT 2000: 113-118 |
2 | EE | Michael Redeker,
Markus Rudack,
Thomas Lobbe,
Dirk Niggemeyer:
Using GLFSRs for Pseudo-Random Memory BIST.
MTDT 2000: 85-94 |
1999 |
1 | EE | Michael Redeker,
Bruce F. Cockburn,
Duncan G. Elliott:
Fault Models and Tests for a 2-Bit-per-Cell MLDRAM.
IEEE Design & Test of Computers 16(1): 22-31 (1999) |