Yue Hao

2008
13	EE	JinFeng Zhang, Yue Hao, JinCheng Zhang, JinYu Ni: The mobility of two-dimensional electron gas in AlGaN/GaN heterostructures with varied Al content. Science in China Series F: Information Sciences 51(6): 780-789 (2008)
2007
12	EE	Ming-e Jing, Yue Hao, Dian Zhou, Xuan Zeng: A Novel Optimization Method for Parametric Yield: Uniform Design Mapping Distance Algorithm. IEEE Trans. on CAD of Integrated Circuits and Systems 26(6): 1149-1155 (2007)
2005
11		Yue Hao, Jiming Liu, Yuping Wang, Yiu-ming Cheung, Hujun Yin, Licheng Jiao, Jianfeng Ma, Yong-Chang Jiao: Computational Intelligence and Security, International Conference, CIS 2005, Xi'an, China, December 15-19, 2005, Proceedings, Part I Springer 2005
10		Yue Hao, Jiming Liu, Yuping Wang, Yiu-ming Cheung, Hujun Yin, Licheng Jiao, Jianfeng Ma, Yong-Chang Jiao: Computational Intelligence and Security, International Conference, CIS 2005, Xi'an, China, December 15-19, 2005, Proceedings, Part II Springer 2005
9	EE	Junping Wang, Yue Hao: Short Critical Area Computational Method Using Mathematical Morphology. CIS (2) 2005: 796-803
8	EE	Ming-e Jing, Yue Hao, Jin-feng Zhang, Peijun Ma: Efficient parametric yield optimization of VLSI circuit by uniform design sampling method. Microelectronics Reliability 45(1): 155-162 (2005)
2003
7	EE	Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma: Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. DFT 2003: 11-17
6	EE	Daoguang Liu, Siliu Xu, Kaicheng Li, Jin Zhang, Rongkan Liu, Yukui Liu, Zhengfan Zhang, Gangyi Hu, Yue Hao: Growth and quality control of MBE-based SiGe-HBT for amplifier applications. Microelectronics Journal 34(5-8): 587-589 (2003)
2002
5	EE	Hongxia Liu, Yue Hao, Jiangang Zhu: A thorough investigation of hot-carrier-induced gate oxide breakdown in partially depleted N- and P-channel SIMOX MOSFETs. Microelectronics Reliability 42(7): 1037-1044 (2002)
2001
4	EE	Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen: Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. DFT 2001: 48-
3	EE	Hongxia Ren, Yue Hao: Study on the degradation induced by donor interface state in deep-sub-micron grooved-gate P-channel MOSFET's. Microelectronics Reliability 41(4): 597-604 (2001)
2000
2	EE	Xiaohong Jiang, Susumu Horiguchi, Yue Hao: Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core. DFT 2000: 30-
1	EE	Tianxu Zhao, Yue Hao, Yong-Chang Jiao: VLSI Yield Optimization Based on the Sub-Processing-Element Level Redundancy. DFT 2000: 41-46

Coauthor Index

1	Taifeng Chen	[4]
2	Yiu-ming Cheung	[10] [11]
3	Xuchao Duan	[7]
4	Susumu Horiguchi	[2]
5	Gangyi Hu	[6]
6	Xiaohong Jiang	[2]
7	Licheng Jiao	[10] [11]
8	Yong-Chang Jiao	[1] [10] [11]
9	Ming-e Jing	[8] [12]
10	Kaicheng Li	[6]
11	Daoguang Liu	[6]
12	Hongxia Liu	[5]
13	Jiming Liu	[10] [11]
14	Rongkan Liu	[6]
15	Yukui Liu	[6]
16	Jianfeng Ma	[10] [11]
17	Peijun Ma	[4] [7] [8]
18	JinYu Ni	[13]
19	Hongxia Ren	[3]
20	Junping Wang	[9]
21	Yuping Wang	[10] [11]
22	Siliu Xu	[6]
23	Hujun Yin	[10] [11]
24	Xuan Zeng	[12]
25	Jin Zhang	[6]
26	Jin-feng Zhang	[8]
27	JinCheng Zhang	[13]
28	JinFeng Zhang	[13]
29	Zhengfan Zhang	[6]
30	Tianxu Zhao	[1] [4] [7]
31	Dian Zhou	[12]
32	Jiangang Zhu	[5]

Colors in the list of coauthors