2008 |
26 | EE | Jenny Leung,
Glenn H. Chapman,
Israel Koren,
Zahava Koren:
Automatic Detection of In-field eld Defect Growth in Image Sensors.
DFT 2008: 305-313 |
2007 |
25 | EE | Jenny Leung,
Jozsef Dudas,
Glenn H. Chapman,
Israel Koren,
Zahava Koren:
Quantitative Analysis of In-Field Defects in Image Sensor Arrays.
DFT 2007: 526-534 |
2006 |
24 | EE | Jozsef Dudas,
Cory Jung,
Linda Wu,
Glenn H. Chapman,
Israel Koren,
Zahava Koren:
On-Line Mapping of In-Field Defects in Image Sensor Arrays.
DFT 2006: 439-447 |
2005 |
23 | EE | Glenn H. Chapman,
Israel Koren,
Zahava Koren,
Jozsef Dudas,
Cory Jung:
On-Line Identification of Faults in Fault-Tolerant Imagers.
DFT 2005: 149-157 |
2004 |
22 | EE | E. Ciocca,
Israel Koren,
Zahava Koren,
C. Mani Krishna,
Daniel S. Katz:
Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer.
PRDC 2004: 43-48 |
21 | EE | Glenn H. Chapman,
Sunjaya Djaja,
Desmond Y. H. Cheung,
Yves Audet,
Israel Koren,
Zahava Koren:
A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction.
IEEE Design & Test of Computers 21(6): 544-551 (2004) |
2003 |
20 | EE | Jayakrishnan Nair,
Zahava Koren,
Israel Koren,
C. Mani Krishna:
Pre-Processing Input Data to Augment Fault Tolerance in Space Applications.
DSN 2003: 491-500 |
2002 |
19 | EE | Zahava Koren,
J. Rajagopal,
C. Mani Krishna,
Israel Koren,
W. Wang,
J. Loman:
Using Rational Approximations for Evaluating the Reliablity of Highly Reliable Systems.
IPDPS 2002 |
2001 |
18 | EE | Israel Koren,
Zahava Koren,
Glenn H. Chapman:
Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip.
DFT 2001: 3-10 |
2000 |
17 | EE | Israel Koren,
Zahava Koren,
Glenn H. Chapman:
A Self-Correcting Active Pixel Camera.
DFT 2000: 56- |
16 | EE | Vijay Lakamraju,
Zahava Koren,
C. Mani Krishna:
Synthesis of Interconnection Networks: A Novel Approach.
DSN 2000: 501- |
15 | EE | Israel Koren,
Zahava Koren:
Incorporating Yield Enhancement into the Floorplanning Process.
IEEE Trans. Computers 49(6): 532-541 (2000) |
1998 |
14 | EE | Israel Koren,
Zahava Koren:
Yield and Routing Objectives in Floorplanning.
DFT 1998: 28-36 |
13 | | Zahava Koren,
Israel Koren,
C. Mani Krishna:
Surge Handling as a Measure of Real-Time System Dependability.
IPPS/SPDP Workshops 1998: 1106-1116 |
12 | | Vijay Lakamraju,
Zahava Koren,
Israel Koren,
C. Mani Krishna:
Measuring the Vulnerability of Interconnection Networks in Embedded Systems.
IPPS/SPDP Workshops 1998: 919-924 |
1997 |
11 | EE | Israel Koren,
Zahava Koren:
Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs.
DFT 1997: 166-174 |
10 | EE | Zahava Koren,
Israel Koren:
On the effect of floorplanning on the yield of large area integrated circuits.
IEEE Trans. VLSI Syst. 5(1): 3-14 (1997) |
1994 |
9 | | Régis Leveugle,
Zahava Koren,
Israel Koren,
Gabriele Saucier,
Norbert Wehn:
The Hyeti Defect Tolerant Microprocessor: A Practical Experiment and its Cost-Effectiveness Analysis.
IEEE Trans. Computers 43(12): 1398-1406 (1994) |
8 | EE | Israel Koren,
Zahava Koren,
Charles H. Stapper:
A statistical study of defect maps of large area VLSI IC's.
IEEE Trans. VLSI Syst. 2(2): 249-256 (1994) |
1993 |
7 | | Zahava Koren,
Israel Koren:
Does the Floorplan of a Chip Affect Its Yield?
DFT 1993: 159-166 |
6 | | Israel Koren,
Zahava Koren,
Charles H. Stapper:
A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits.
IEEE Trans. Computers 42(6): 724-734 (1993) |
1991 |
5 | | Aura Ganz,
Zahava Koren:
WDM Passive Star-Protocols and Performance Analysis.
INFOCOM 1991: 991-1000 |
4 | | Israel Koren,
Zahava Koren:
Discrete and Continuous Models for the Performance of Reconfigurable Multistage Systems.
IEEE Trans. Computers 40(9): 1024-1033 (1991) |
1988 |
3 | | Israel Koren,
Zahava Koren:
On the Bandwidth of a Multi-Stage Network in the Presence of Faulty Components.
ICDCS 1988: 26-32 |
1986 |
2 | EE | Zahava Koren,
Imrich Chlamtac,
Aura Ganz:
A model for evaluating demand assignment protocols with arbitrary workloads.
SIGCOMM 1986: 40-44 |
1 | | Israel Koren,
Zahava Koren,
Stephen Y. H. Su:
Analaysis of a Class of Recovery Procedures.
IEEE Trans. Computers 35(8): 703-712 (1986) |