Pramodchandran N. Variyam

2004
16	EE	John M. Hitchcock, Aduri Pavan, Pramodchandran N. Variyam: Partial Bi-Immunity and NP-Completeness Electronic Colloquium on Computational Complexity (ECCC)(025): (2004)
2003
15	EE	Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam: Automatic Diagnostic Program Generation for Mixed Signal Load Board. ITC 2003: 403-409
2002
14	EE	Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley: Measuring Stray Capacitance on Tester Hardware. VTS 2002: 351-356
13	EE	Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee: Prediction of analog performance parameters using fast transienttesting. IEEE Trans. on CAD of Integrated Circuits and Systems 21(3): 349-361 (2002)
2000
12		Pramodchandran N. Variyam: Increasing the IDDQ test resolution using current prediction. ITC 2000: 217-224
11		Pramodchandran N. Variyam, Vinay Agrawal: Measuring code edges of ADCs using interpolation and its application to offset and gain error testing. ITC 2000: 349-357
10	EE	Pramodchandran N. Variyam, Abhijit Chatterjee: Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. IEEE Design & Test of Computers 17(3): 106-115 (2000)
9	EE	Pramodchandran N. Variyam, Abhijit Chatterjee: Specification-driven test generation for analog circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 19(10): 1189-1201 (2000)
1999
8	EE	Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee: Test Generation for Analog Circuits Using Partial Numerical Simulation. VLSI Design 1999: 597-602
7	EE	Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee: Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation. VTS 1999: 214-219
1998
6	EE	Pramodchandran N. Variyam, Abhijit Chatterjee: Specification-Driven Test Design for Analog Circuits. DFT 1998: 335-340
5	EE	Pramodchandran N. Variyam, Abhijit Chatterjee: Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements. VTS 1998: 132-137
4	EE	Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi: Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. VTS 1998: 145-151
1997
3	EE	Pramodchandran N. Variyam, Abhijit Chatterjee: Test generation for comprehensive testing of linear analog circuits using transient response sampling. ICCAD 1997: 382-385
2	EE	Pramodchandran N. Variyam, Abhijit Chatterjee: FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation. VLSI Design 1997: 408-412
1	EE	Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi: Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. VTS 1997: 261-266

Coauthor Index

1	Vinay Agrawal	[11]
2	Abhijit Chatterjee	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [13] [14]
3	Sasikumar Cherubal	[13]
4	Achintya Halder	[14]
5	John M. Hitchcock	[16]
6	Junwei Hou	[7] [8]
7	Bruce C. Kim	[15]
8	Naveena Nagi	[1] [4]
9	Aduri Pavan	[16]
10	Kranthi K. Pinjala	[15]
11	John Ridley	[14]
12	Heebyung Yoon	[4]

Colors in the list of coauthors