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| 1998 | ||
|---|---|---|
| 1 | EE | Leon J. P. Vogels, M. W. C. Dohmen, P. Van Duijvenboden, Robert A. Latimer, J. D. O. Heffernan: A Yield Improvement Program Using Process Control and Process Optimization for Particle Reduction Using In Situ Particle Monitoring on a Semitool Magnum. DFT 1998: 11-16 |
| 1 | M. W. C. Dohmen | [1] |
| 2 | P. Van Duijvenboden | [1] |
| 3 | J. D. O. Heffernan | [1] |
| 4 | Leon J. P. Vogels | [1] |