2007 |
25 | EE | Yifeng Cui,
Reagan Moore,
Kim Olsen,
Amit Chourasia,
Philip Maechling,
Bernard Minster,
Steven M. Day,
Yuanfang Hu,
Jing Zhu,
Amitava Majumdar,
Thomas Jordan:
Enabling Very-Large Scale Earthquake Simulations on Parallel Machines.
International Conference on Computational Science (1) 2007: 46-53 |
2006 |
24 | EE | Amitava Majumdar,
Wei-Yu Chen,
Jun Guo:
Hold time validation on silicon and the relevance of hazards in timing analysis.
DAC 2006: 326-331 |
23 | EE | Tharaka Devadithya,
Kim Baldridge,
Adam Birnbaum,
Amitava Majumdar,
Dong Ju Choi,
Richard Wolski,
Simon K. Warfield,
Neculai Archip:
On-Demand High Performance Computing: Image Guided Neuro-Surgery Feasibility Study.
ICPADS (2) 2006: 97-102 |
2005 |
22 | EE | Amitava Majumdar,
Adam Birnbaum,
Dong Ju Choi,
Abhishek Trivedi,
Simon K. Warfield,
Kim Baldridge,
Petr Krysl:
A Dynamic Data Driven Grid System for Intra-operative Image Guided Neurosurgery.
International Conference on Computational Science (2) 2005: 672-679 |
2003 |
21 | EE | Olivier Caty,
Ismet Bayraktaroglu,
Amitava Majumdar,
Richard Lee,
John Bell,
Lisa Curhan:
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects.
ITC 2003: 961-970 |
2002 |
20 | EE | Ishwar Parulkar,
Thomas A. Ziaja,
Rajesh Pendurkar,
Anand D'Souza,
Amitava Majumdar:
A Scalable, Low Cost Design-for-Test Architecture for UltraSPARC? Chip Multi-Processors.
ITC 2002: 726-735 |
19 | EE | Yuni K. Dewaraja,
Michael Ljungberg,
Amitava Majumdar,
Abhijit Bose,
Kenneth F. Koral:
A parallel Monte Carlo code for planar and SPECT imaging: implementation, verification and applications in 131I SPECT.
Computer Methods and Programs in Biomedicine 67(2): 115-124 (2002) |
2001 |
18 | | Kamran Zarrineh,
Thomas A. Ziaja,
Amitava Majumdar:
Automatic Generation and Validation of Memory Test Models for High Performance Microprocessors.
ICCD 2001: 526-529 |
2000 |
17 | EE | Amitava Majumdar:
arallel Performance Study of Monte Carlo Photon Transport Code on Shared-, Distributed-, and Distributed-Shared-Memory Architectures.
IPDPS 2000: 93- |
16 | EE | Dimitri Kagaris,
Spyros Tragoudas,
Amitava Majumdar:
Test-set partitioning for multi-weighted random LFSRs.
Integration 30(1): 65-75 (2000) |
1998 |
15 | EE | Dimitrios Kagaris,
Spyros Tragoudas,
Amitava Majumdar:
On-Chip Test Embedding for Multi-Weighted Random LFSRs.
DFT 1998: 135- |
14 | EE | Amitava Majumdar,
Michio Komoda,
Tim Ayres:
Ground Bounce Considerations in DC Parametric Test Generation Using Boundary Scan.
VTS 1998: 86-91 |
1997 |
13 | EE | Rahul Simha,
Amitava Majumdar:
An urn model with applications to database performance evaluation.
Computers & OR 24(4): 289-300 (1997) |
1996 |
12 | | Dimitrios Kagaris,
Spyros Tragoudas,
Amitava Majumdar:
On the Use of Counters for Reproducing Deterministic Test Sets.
IEEE Trans. Computers 45(12): 1405-1419 (1996) |
11 | | Amitava Majumdar:
On Evaluating and Optimizing Weights for Weighted Random Pattern Testing.
IEEE Trans. Computers 45(8): 904-916 (1996) |
1995 |
10 | | Amitava Majumdar,
Sarma B. K. Vrudhula:
Fault Coverage and Test Length Estimation for Random Pattern Testing.
IEEE Trans. Computers 44(2): 234-247 (1995) |
1994 |
9 | | Amitava Majumdar:
WRAPTure: A Tool for Evaluation and Optimization of Weights for Weighted Random Pattern Testing.
ICCD 1994: 288-291 |
8 | | Rahul Simha,
Amitava Majumdar:
On Lookahead in the List Update Problem.
Inf. Process. Lett. 50(2): 105-110 (1994) |
7 | EE | Amitava Majumdar,
Sarma B. K. Vrudhula:
Techniques for estimating test length under random test.
J. Electronic Testing 5(2-3): 285-297 (1994) |
1993 |
6 | | Amitava Majumdar,
Sarma Sastry:
Statistical Analysis of Controllability.
VLSI Design 1993: 55-60 |
5 | EE | Amitava Majumdar,
Sarma Sastry:
Probabilistic characterization of controllability in general homogeneous circuits.
Computer-Aided Design 25(2): 76-93 (1993) |
4 | EE | Amitava Majumdar,
Sarma B. K. Vrudhula:
Analysis of signal probability in logic circuits using stochastic models.
IEEE Trans. VLSI Syst. 1(3): 365-379 (1993) |
1992 |
3 | EE | Amitava Majumdar,
Sarma Sastry:
On the Distribution of Fault Coverage and Test length in Random Testing of Combinational Circuits.
DAC 1992: 341-346 |
1991 |
2 | EE | Sarma Sastry,
Amitava Majumdar:
A Branching Process Model for Observability Analysis of Combinational Circuits.
DAC 1991: 452-457 |
1 | EE | Sarma Sastry,
Amitava Majumdar:
Test efficiency analysis of random self-test of sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(3): 390-398 (1991) |