| 2001 |
|---|
| 5 | EE | Alfred V. Gomes,
Abhijit Chatterjee:
Distance Constrained Dimensionality Reduction for Parametric Fault Test Generator.
Asian Test Symposium 2001: 411-416 |
| 1999 |
|---|
| 4 | EE | Alfred V. Gomes,
Abhijit Chatterjee:
Minimal Length Diagnostic Tests for Analog Circuits using Test History.
DATE 1999: 189-194 |
| 3 | EE | Alfred V. Gomes,
Abhijit Chatterjee:
Robust optimization based backtrace method for analog circuits.
ICCAD 1999: 304-308 |
| 1998 |
|---|
| 2 | EE | Alfred V. Gomes,
Ramakrishna Voorakaranam,
Abhijit Chatterjee:
Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity.
DFT 1998: 341-348 |
| 1997 |
|---|
| 1 | | Ramakrishna Voorakaranam,
Sudip Chakrabarti,
Junwei Hou,
Alfred V. Gomes,
Sasikumar Cherubal,
Abhijit Chatterjee,
William H. Kao:
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis.
ITC 1997: 903-912 |
