2006 |
13 | EE | Donald B. Shaw,
Dhamin Al-Khalili,
Come Rozon:
Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries.
Integration 39(4): 382-406 (2006) |
2005 |
12 | | Hussam Al-Hertani,
Dhamin Al-Khalili,
Come Rozon:
Leakage power dissipation in UDSM logic gates.
Circuits, Signals, and Systems 2005: 132-136 |
2003 |
11 | EE | Donald B. Shaw,
Dhamin Al-Khalili,
Come Rozon:
IC Bridge Fault Modeling for IP Blocks Using Neural Network-Based VHDL Saboteurs.
IEEE Trans. Computers 52(10): 1285-1297 (2003) |
2002 |
10 | EE | Donald B. Shaw,
Dhamin Al-Khalili,
Come Rozon:
Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models.
Integration 32(1-2): 77-97 (2002) |
2001 |
9 | EE | Donald B. Shaw,
Dhamin Al-Khalili,
Come Rozon:
Accurate CMOS Bridge Fault Modeling with Neural Network-Based VHDL Saboteurs.
ICCAD 2001: 531-536 |
8 | EE | Donald B. Shaw,
Dhamin Al-Khalili,
Come Rozon:
Deriving accurate ASIC cell fault models for VITAL compliant VHDL simulation.
ISCAS (5) 2001: 263-266 |
1998 |
7 | EE | Jason Coppens,
Dhamin Al-Khalili,
Come Rozon:
VHDL Modelling and Analysis of Fault Secure Systems.
DATE 1998: 148-152 |
6 | EE | Dhamin Al-Khalili,
Saman Adham,
Come Rozon,
Moazzem Hossain,
D. Racz:
Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits.
DFT 1998: 84-92 |
1996 |
5 | EE | Come Rozon:
On the Use of VHDL as a Multi-Valued Logic Simulator.
ISMVL 1996: 110- |
1995 |
4 | | D. B. Gravel,
Germain Drolet,
Come Rozon:
Improved VLSI Design for Decoding Concatenated Codes Comprising an Irreducible Cyclic Code and a Reed-Solomon Code.
Information Theory and Applications 1995: 104-110 |
1993 |
3 | | Michael Ogbonna Esonu,
Dhamin Al-Khalili,
Come Rozon:
Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits.
ISCAS 1993: 1714-1717 |
1992 |
2 | EE | Dhamin Al-Khalili,
Come Rozon,
B. Stewart:
Testability analysis and fault modeling of BiCMOS circuits.
J. Electronic Testing 3(3): 207-217 (1992) |
1991 |
1 | | Come Rozon,
H. T. Mouftah:
Testability Analysis of CMOS Temary Circuits.
ISMVL 1991: 158-165 |