dblp.uni-trier.dewww.uni-trier.de

Come Rozon

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2006
13EEDonald B. Shaw, Dhamin Al-Khalili, Come Rozon: Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries. Integration 39(4): 382-406 (2006)
2005
12 Hussam Al-Hertani, Dhamin Al-Khalili, Come Rozon: Leakage power dissipation in UDSM logic gates. Circuits, Signals, and Systems 2005: 132-136
2003
11EEDonald B. Shaw, Dhamin Al-Khalili, Come Rozon: IC Bridge Fault Modeling for IP Blocks Using Neural Network-Based VHDL Saboteurs. IEEE Trans. Computers 52(10): 1285-1297 (2003)
2002
10EEDonald B. Shaw, Dhamin Al-Khalili, Come Rozon: Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models. Integration 32(1-2): 77-97 (2002)
2001
9EEDonald B. Shaw, Dhamin Al-Khalili, Come Rozon: Accurate CMOS Bridge Fault Modeling with Neural Network-Based VHDL Saboteurs. ICCAD 2001: 531-536
8EEDonald B. Shaw, Dhamin Al-Khalili, Come Rozon: Deriving accurate ASIC cell fault models for VITAL compliant VHDL simulation. ISCAS (5) 2001: 263-266
1998
7EEJason Coppens, Dhamin Al-Khalili, Come Rozon: VHDL Modelling and Analysis of Fault Secure Systems. DATE 1998: 148-152
6EEDhamin Al-Khalili, Saman Adham, Come Rozon, Moazzem Hossain, D. Racz: Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. DFT 1998: 84-92
1996
5EECome Rozon: On the Use of VHDL as a Multi-Valued Logic Simulator. ISMVL 1996: 110-
1995
4 D. B. Gravel, Germain Drolet, Come Rozon: Improved VLSI Design for Decoding Concatenated Codes Comprising an Irreducible Cyclic Code and a Reed-Solomon Code. Information Theory and Applications 1995: 104-110
1993
3 Michael Ogbonna Esonu, Dhamin Al-Khalili, Come Rozon: Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. ISCAS 1993: 1714-1717
1992
2EEDhamin Al-Khalili, Come Rozon, B. Stewart: Testability analysis and fault modeling of BiCMOS circuits. J. Electronic Testing 3(3): 207-217 (1992)
1991
1 Come Rozon, H. T. Mouftah: Testability Analysis of CMOS Temary Circuits. ISMVL 1991: 158-165

Coauthor Index

1Saman Adham [6]
2Hussam Al-Hertani [12]
3Dhamin Al-Khalili [2] [3] [6] [7] [8] [9] [10] [11] [12] [13]
4Jason Coppens [7]
5Germain Drolet [4]
6Michael Ogbonna Esonu [3]
7D. B. Gravel [4]
8Moazzem Hossain [6]
9H. T. Mouftah (Hussein T. Mouftah) [1]
10D. Racz [6]
11Donald B. Shaw [8] [9] [10] [11] [13]
12B. Stewart [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)