| |
| 1999 | ||
|---|---|---|
| 2 | David R. Lakin II, Adit D. Singh: Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. ITC 1999: 23-30 | |
| 1998 | ||
| 1 | EE | Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh: Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10 |
| 1 | Phil Nigh | [1] |
| 2 | Adit D. Singh | [1] [2] |
| 3 | Gaurav Sinha | [1] |