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David R. Lakin II

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1999
2 David R. Lakin II, Adit D. Singh: Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. ITC 1999: 23-30
1998
1EEAdit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh: Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10

Coauthor Index

1Phil Nigh [1]
2Adit D. Singh [1] [2]
3Gaurav Sinha [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)