| 1999 |
|---|
| 4 | EE | Frederic Duvivier:
Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production.
DFT 1999: 61- |
| 1998 |
|---|
| 3 | EE | Sandrine Barberan,
Frederic Duvivier:
Management of Critical Areas and Defectivity Data for Yield Trend Modeling.
DFT 1998: 17- |
| 1997 |
|---|
| 2 | EE | Sandra Levasseur,
Frederic Duvivier:
Application of a yield model merging critical areas and defectivity to industrial products.
DFT 1997: 11-19 |
| 1993 |
|---|
| 1 | | Frederic Duvivier,
M. Rivier,
B. Burtschy,
J. J. Charlot:
Use of a Segmentation Technique to Analyze the Variability of the Yield of a Mature CMOS SRAM.
DFT 1993: 152-158 |
