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Claude Thibeault

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2007
28EEClaude Thibeault: On a New Outlier Rejection Technique. VTS 2007: 97-103
2004
27EEClaude Thibeault: On New Current Signatures and Adaptive Test Technique Combination. VTS 2004: 59-64
2003
26EEY. Hariri, Claude Thibeault: 3DSDM: A 3 Data-Source Diagnostic Method. DFT 2003: 117-123
25EEClaude Thibeault: Replacing IDDQ Testing: With Variance Reduction. J. Electronic Testing 19(3): 325-340 (2003)
24EEClaude Thibeault: On Faster IDDQ Measurements. J. Electronic Testing 19(6): 625-635 (2003)
2002
23EEBing Qiu, Yvon Savaria, Meng Lu, Chunyan Wang, Claude Thibeault: Yield Modeling of a WSI Telecom Router Architecture. DFT 2002: 314-324
22EEClaude Thibeault: Speeding-Up IDDQ Measurements. VTS 2002: 295-301
2001
21EEGinette Monté, Bernard Antaki, Serge Patenaude, Yvon Savaria, Claude Thibeault, Pieter M. Trouborst: Tools for the Characterization of Bipolar CML Testability. VTS 2001: 388-395
2000
20 Claude Thibeault: Improving Delta-I_DDQ-based test methods. ITC 2000: 207-216
19EEClaude Thibeault: Efficient Diagnosis of Single/Double Bridging Faults with Delta Iddq Probabilistic Signatures and Viterbi Algorithm. VTS 2000: 431-438
18EEClaude Thibeault: On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults. IEEE Trans. Computers 49(6): 575-587 (2000)
17EEClaude Thibeault: Diagnosis Method Using DeltaIDDQ Probabilistic Signatures: Theory and Results. J. Electronic Testing 16(4): 339-353 (2000)
1999
16 Claude Thibeault: An histogram based procedure for current testing of active defects. ITC 1999: 714-723
15EEClaude Thibeault: On the Comparison of IDDQ and IDDQ Testing. VTS 1999: 143-151
14 Claude Thibeault, Guy Bégin: A Scan-Based Configurable, Programmable and Scalable Architecture for Sliding Window-Based Operations. IEEE Trans. Computers 48(6): 615-627 (1999)
1998
13EEClaude Thibeault: Increasing Current Testing Resolution. DFT 1998: 126-134
12EEClaude Thibeault, Luc Boisvert: On the Current Behavior of Faulty and Fault-Free ICs and the Impact on Diagnosis. DFT 1998: 202-210
11EEClaude Thibeault, Luc Boisvert: Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results. ITC 1998: 1019-1026
1997
10EEMichel Kafrouni, Claude Thibeault, Yvon Savaria: A Cost Model for VLSI / MCM Systems. DFT 1997: 148-156
9EEYves Gagnon, Yvon Savaria, Michel Meunier, Claude Thibeault: Are defect-tolerant circuits with redundancy really cost-effective? Complete and realistic cost model. DFT 1997: 157-165
8EEClaude Thibeault: A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures. VTS 1997: 80-87
1996
7 Yervant Zorian, Tom Anderson, Yvon Savaria, Claude Thibeault, André Ivanov: Panel Summaries. IEEE Design & Test of Computers 13(3): 6, 110-112 (1996)
1995
6EEClaude Thibeault: Detection and location of faults and defects using digital signal processing. VTS 1995: 262-269
5 Claude Thibeault, Yvon Savaria, Jean-Louis Houle: Equivalence Proofs of Some Yield Modeling Methods for Defect-Tolerant Integrated Circuits. IEEE Trans. Computers 44(5): 724-728 (1995)
1994
4 Claude Thibeault: Using Fourier Analysis to Enhance IC Testability. DFT 1994: 280-298
3 Claude Thibeault, Yvon Savaria, Jean-Louis Houle: A Fast Method to Evaluate the Optimum Number of Spares in Defect-Tolerant Integrated Circuits. IEEE Trans. Computers 43(6): 687-698 (1994)
1993
2 J. Crépeau, Claude Thibeault, Yvon Savaria: Some Results on Yield and Local Design Rule Relaxation. DFT 1993: 144-151
1992
1EEClaude Thibeault, Yvon Savaria, Jean-Louis Houle: Test quality of hierarchical defect-tolerant integrated circuits. J. Electronic Testing 3(1): 93-102 (1992)

Coauthor Index

1Tom Anderson [7]
2Bernard Antaki [21]
3Guy Bégin [14]
4Luc Boisvert [11] [12]
5J. Crépeau [2]
6Yves Gagnon [9]
7Y. Hariri [26]
8Jean-Louis Houle [1] [3] [5]
9André Ivanov [7]
10Michel Kafrouni [10]
11Meng Lu [23]
12Michel Meunier [9]
13Ginette Monté [21]
14Serge Patenaude [21]
15Bing Qiu [23]
16Yvon Savaria [1] [2] [3] [5] [7] [9] [10] [21] [23]
17Pieter M. Trouborst [21]
18Chunyan Wang [23]
19Yervant Zorian [7]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)