| 2005 |
|---|
| 7 | EE | Anup P. Jose,
Keith A. Jenkins,
Scott K. Reynolds:
On-Chip Spectrum Analyzer for Analog Built-In Self Test.
VTS 2005: 131-136 |
| 6 | EE | John U. Knickerbocker,
Paul S. Andry,
L. Paivikki Buchwalter,
Alina Deutsch,
Raymond R. Horton,
Keith A. Jenkins,
Young Hoon Kwark,
Gerald McVicker,
Chirag S. Patel,
Robert J. Polastre,
Christian D. Schuster,
Arun Sharma,
Sri M. Sri-Jayantha,
Christopher W. Surovic,
Cornelia K. Tsang,
Buck C. Webb,
Steven L. Wright,
Samuel R. McKnight,
Edmund J. Sprogis,
Bing Dang:
Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection.
IBM Journal of Research and Development 49(4-5): 725-754 (2005) |
| 2004 |
|---|
| 5 | EE | Stas Polonsky,
Keith A. Jenkins,
Alan J. Weger,
Shinho Cho:
CMOS IC diagnostics using the luminescence of OFF-state leakage currents.
ITC 2004: 134-139 |
| 2003 |
|---|
| 4 | EE | Jean-Olivier Plouchart,
Noah Zamdmer,
Jonghae Kim,
Melanie Sherony,
Yue Tan,
Asit Ray,
Mohamed Talbi,
Lawrence F. Wagner,
Kun Wu,
Naftali E. Lustig,
Shreesh Narasimha,
Patricia O'Neil,
Nghia Phan,
Michael Rohn,
James Strom,
David M. Friend,
Stephen V. Kosonocky,
Daniel R. Knebel,
Suhwan Kim,
Keith A. Jenkins,
Michel M. Rivier:
Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits.
IBM Journal of Research and Development 47(5-6): 611-630 (2003) |
| 2000 |
|---|
| 3 | EE | Keith A. Jenkins,
James P. Eckhardt:
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops.
IEEE Design & Test of Computers 17(2): 86-93 (2000) |
| 1998 |
|---|
| 2 | EE | Stephen V. Kosonocky,
Arthur A. Bright,
Kevin W. Warren,
Ruud A. Haring,
Steve Klepner,
Sameh W. Asaad,
S. Basavaiah,
Bob Havreluk,
David F. Heidel,
Michael Immediato,
Keith A. Jenkins,
Rajiv V. Joshi,
Ben Parker,
T. V. Rajeevakumar,
Kevin G. Stawiasz:
Designing a Testable System on a Chip.
VTS 1998: 2-7 |
| 1997 |
|---|
| 1 | EE | Keith A. Jenkins:
Detecting and Preventing Measurement Errors.
IEEE Design & Test of Computers 14(4): 78-86 (1997) |
