2003 |
6 | EE | M.-J. Edward Lee,
William J. Dally,
Ramin Farjad-Rad,
Hiok-Tiaq Ng,
Ramesh Senthinathan,
John H. Edmondson,
John Poulton:
CMOS High-Speed I/Os - Present and Future.
ICCD 2003: 454-461 |
1998 |
5 | | Matt Reilly,
John H. Edmondson:
Performance Simulation of an Alpha Microprocessor.
IEEE Computer 31(5): 50-58 (1998) |
1997 |
4 | EE | Dilip K. Bhavsar,
John H. Edmondson:
Alpha 21164 Testability Strategy.
IEEE Design & Test of Computers 14(1): 25-33 (1997) |
1995 |
3 | | William J. Bowhill,
Shane L. Bell,
Bradley J. Benschneider,
Andrew J. Black,
Sharon M. Britton,
Ruben W. Castelino,
Dale R. Donchin,
John H. Edmondson,
Harry R. Fair III,
Paul E. Gronowski,
Anil K. Jain,
Patricia L. Kroesen,
Marc E. Lamere,
Bruce J. Loughlin,
Shekhar Mehta,
Robert O. Mueller,
Ronald P. Preston,
Sribalan Santhanam,
Timothy A. Shedd,
Michael J. Smith,
Stephen C. Thierauf:
Circuit Implementation of a 300-MHz 64-bit Second-generation CMOS Alpha CPU
Digital Technical Journal 7(1): 0- (1995) |
2 | | John H. Edmondson,
Paul I. Rubinfeld,
Peter J. Bannon,
Bradley J. Benschneider,
Debra Bernstein,
Ruben W. Castelino,
Elizabeth M. Cooper,
Daniel E. Dever,
Dale R. Donchin,
Timothy C. Fischer,
Anil K. Jain,
Shekhar Mehta,
Jeanne E. Meyer,
Ronald P. Preston,
Vidya Rajagopalan,
Chandrasekhara Somanathan,
Scott A. Taylor,
Gilbert M. Wolrich:
Internal Organization of the Alpha 21164, a 300-MHz 64-bit Quad-issue CMOS RISC Microprocessor
Digital Technical Journal 7(1): 0- (1995) |
1994 |
1 | | Dilip K. Bhavsar,
John H. Edmondson:
Testability Strategy of the ALPHA AXP 21164 Microprocessor.
ITC 1994: 50-59 |