| |
| 1997 | ||
|---|---|---|
| 2 | EE | Donald Staab, Eugene R. Hnatek: Diagnosing IC Failures in a Fast Environment. IEEE Design & Test of Computers 14(3): 70-75 (1997) |
| 1996 | ||
| 1 | Donald Staab: Practical Issues of Failure Diagnosis and Analysis in a Fast Cycle Time Environment. ITC 1996: 936 | |
| 1 | Eugene R. Hnatek | [2] |