| 2003 |
|---|
| 10 | EE | Thomas S. Barnett,
Adit D. Singh,
Victor P. Nelson:
Extending integrated-circuit yield-models to estimate early-life reliability.
IEEE Transactions on Reliability 52(3): 296-300 (2003) |
| 2001 |
|---|
| 9 | EE | Thomas S. Barnett,
Adit D. Singh,
Victor P. Nelson:
Yield-Reliability Modeling for Fault Tolerant Integrated Circuits.
DFT 2001: 29-38 |
| 8 | | Thomas S. Barnett,
Adit D. Singh,
Victor P. Nelson:
Estimating burn-in fall-out for redundant memory.
ITC 2001: 340-347 |
| 7 | EE | Thomas S. Barnett,
Adit D. Singh,
Victor P. Nelson:
Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model.
VTS 2001: 326-332 |
| 1997 |
|---|
| 6 | EE | Christopher G. Knight,
Adit D. Singh,
Victor P. Nelson:
An IDDQ Sensor for Concurrent Timing Error Detection.
DFT 1997: 281-289 |
| 5 | | Victor P. Nelson:
Which tester is right for your MCM?
IEEE Design & Test of Computers 14(4): 4-5 (1997) |
| 1991 |
|---|
| 4 | | C.-J. Wang,
Victor P. Nelson:
Petri net performance modeling of a modified mesh-connected parallel computer.
Parallel Computing 17(1): 75-84 (1991) |
| 1990 |
|---|
| 3 | | Victor P. Nelson:
Fault-Tolerant Computing: Fundamental Concepts.
IEEE Computer 23(7): 19-25 (1990) |
| 1981 |
|---|
| 2 | | Suchai Thanawastien,
Victor P. Nelson:
Interference Analysis of Shuffle/Exchange Networks.
IEEE Trans. Computers 30(8): 545-556 (1981) |
| 1980 |
|---|
| 1 | | D. V. Satishchandra,
Victor P. Nelson:
A Reconfigurable Distributed Digital Filter.
IEEE Real-Time Systems Symposium 1980: 90-96 |
