Robert Wu
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1997
1
EE
Robert Wu,
Jerry Gerner
,
Richard Wheelus
,
Kevin Lew
: Testing Logic-Intensive Memory ICs on Memory Testers.
IEEE Design & Test of Computers 14
(1): 50-54 (1997)
Coauthor
Index
1
Jerry Gerner
[
1
]
2
Kevin Lew
[
1
]
3
Richard Wheelus
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
